Journal Papers

• Photon approach to diffraction, interference, optical coherence, and image formation,
  M. T. Tavassoly, M. J. Siavashani, and AR. Moradi, Optics Express, 31 (17), 2023.
• Optical diffractometry by rough phase steps,
  M. J. Siavashani, E. Nasimdoust, P. Elahi, M. T. Tavassoly, and AR. Moradi, Scientific Reports, 13 (1), 2023.
• The effect of edge sharpness on phase-step diffractometry,
  M. J. Siavashani, M. T. Tavassoly, and AR. Moradi, Optics and Lasers in Engineering, 145 (106666), 2021.
• 3D imaging using scanning diffractometry,
  M. J. Siavashani, I. Naghedi, V. Abbasian, E. A. Akhlaghi, M. A. Charsooghi, M. T. Tavassoly, and AR. Moradi, Scientific Reports, 11 (482), 2021.
• Characterization of transparent thin films by low-coherent diffractometry,
  M. J. Siavashani, E. A. Akhlaghi, M. T. Tavassoly, and S. R. Hosseini, Journal of optics, 20 (3), 2018.

Conference Papers

• Diffraction from rough phase steps,
  M. J. Siavashani, E. Nasimdoust, P. Elahi, and AR. Moradi, SPIE Optical Sensing and Detection VII, 2022.
• Investigation of phase-shift algorithms affected by error sources,
  M. Khanjani, S. Hosseini, M. J. Siavashani, H. Borzouei, E. A. Akhlaghi, ICOP & ICPET 28, 2022.
• Application of diffractometry in coating rate measurement,
  M. J. Siavashani, E. A. Akhlaghi, M. T. Tavassoli, ICOP & ICPET 26, 2020.
• Measurement of spherical form of ball with interferometric microscopy,
  H. Borzouei, M. J. Siavashani, Second International Conference on New Technologies in Science, 2019.
• Scanning diffractometry for three dimensional imaging,
  M. J. Siavashani, I. Naghedi, E. A. Akhlaghi, M. A. Charsooghi, M. T. Tavassoly, and A. R. Moradi, IASBS Ph.D. day, 2018 (Winner of the best poster).
• Measuring optical characterization of material by Fresnel diffraction from a phase step,
  M. J. Siavashani, M. T. Tavassoly, and E. A. Akhlaghi, IASBS Ph.D. day, 2017.
• Measuring refractive index and thickness of transparent thin films using Fresnel diffraction from phase step,
  M. J. Siavashani, M. T. Tavassoly, E. A. Akhlaghi, and S. R. Hosseini, ICOP & ICPET 21, 1473–1476, 2015.
• Thickness measurement using the extrema of the intensity profile in Fresnel diffraction from a phase step,
  Y. Ganjkhani, M. T. Tavassoli, S. R. Hosseini, M. J. Siavashani, and A. Koohian, ICOP & ICPET 21, 777–780, 2015.
• Fourier Transform Spectroscopy Using Fresnel Diffraction from Phase Step,
  S. R. Hosseini, M. T. Tavassoly, and M. J. Siavashani, ICOP & ICPET 20, 1365–1368, 2014 (Winner of the best poster).